Modular and Compact Interferometers

by | May 29, 2012

Modular and compact “µPhase” interferometers which offer objective and precise measurement results of surface and wavefront measurements.

The interferometers can be used in almost any working environment. They are used for measuring the surface quality or wavefront aberration in double transmission of specular high precision components made of glass, plastic, metal, ceramic, etc. The non-contact measurement method prevents damage to the sample under test and gives the most exact evaluation of the entire surface or wavefront. The ultra wide measurement range of optics and surfaces allows the measurement of materials with reflectivities from 0.3% to 100%. A second camera facilitates the alignment of the test sample. Twyman-Green and Fizeau mode are selectable. These measurement is perfectly complemented by the “µShape” measurement and analysis software to fulfill the highest expectations of quality management.