The functional core of the measurement mode is the sensor for optical profilometry, now fixed in the microscope objective turret. The system measures the surface topography of large samples and correlates it with confocal Raman microscopy. This allows very rough or heavily inclined samples to be chemically characterized precisely, automatically and easily while also being confocally imaged. Extensive, time-consuming sample preparation is rendered obsolete, and the sample is analyzed in its original state while performing microscopic 3D Raman Imaging measurements on the sub-micron scale with best confocality.
Integrated Imaging System for Topographic Raman Imaging
Imaging option “TrueSurface microscopy”, now available also as an integrated option for the alpha300” microscope series. This development enables topographic Raman Imaging on large samples for the full range of WITec instruments. The new imaging mode is also available as an upgrade for installed “alpha300” and “alpha500” systems.