In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation with equipment like the Leica EM TXP target surfacing systems and the Leica EM TIC 3X ion beam milling system. In the interview, Imène Estève, engineer at the Centre National de Recherches Scientifiques (CNRS) and head of the SEM-FIB national facility, in charge of running the lab, tells us about how this cooperation has developed.
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