A comprehensive review of the state of the art and advances, future potential, and development trends of optical imaging and optical metrology. [XX, 482 Pages, Hardcover]Read More...Powered by WPeMatico

  A state-of-the-art overview of high-k dielectric materials for advanced field-effect transistors, from both a fundamental and a technological viewpoint, summarizing the latest research results and development solutions. [XXXII, 558 Pages, Hardcover]Read...

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  The first in-depth treatment of the topic, this handy reference covers everything from fundamentals to the latest research results. A practical approach is used throughout, providing sufficient theory and modeling to understand the principles behind the...

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